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Ivy Tech Community College Fort Wayne Awarded NSF Grant to Enhance Workforce Development

Ivy Tech Community College Fort Wayne has been awarded a prestigious grant from the U.S. National Science Foundation (NSF) through the Enabling Partnerships to Increase Innovation Capacity (EPIIC) program. The EPIIC program’s goal is to strengthen partnerships with industry, business, and economic development organizations in the fields of advanced manufacturing and emerging technology. This will be achieved by implementing the Business and Industry Leadership Team (BILT) advisory council model. For more details on the project, visit NSF EPIIC Project.

BILT Members

  • Anthony Nighswander
    President
    APT Manufacturing Solutions


    Logan Glaze

    VP, Sales & Marketing
    Glaze Tool and Engineering, Inc.

     

    Travis Boleyn
    HR Generalist, Maintenance Apprenticeship Program Lead
    Continental- Original Equipment Solutions Automotive USA

    Continental IT Compliance Manager (m/f/d) Original Equipment Solutions - REF86014I | SmartRecruiters

     

    Devin Renkenberger
    Maintenance Superintendent
    Continental- Original Equipment Solutions Automotive USA

    Continental IT Compliance Manager (m/f/d) Original Equipment Solutions - REF86014I | SmartRecruiters

  • We're currently recruiting new members! If you're interested in joining a BILT, please fill out the interest form or reach out to Michelle Ashley at mashley22@ivytech.edu or 260-480-2029.

Join the BILT Today!

We are currently recruiting members for the Industrial Technology, Advanced Automation & Robotics Technology, and Welding BILTs. Help us shape the future of workforce development by becoming part of Ivy Tech’s Business & Industry Leadership Team. Your expertise will contribute to creating innovative programs that prepare graduates to meet the ever-changing needs of the workforce.

Be a part of building the workforce of tomorrow. Join BILT today!

Complete an interest form

 

 

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*Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.